Working with collaborators, we have developed technological advances centered on an atomic force microscope (AFM).
1. We are currently working on a nanopore system for combined AFM and electrical recording of ion channels (ACS Appl. Mater. Interfaces, 2014, 6 (7), pp 5290–5296)
2. We have developed custom cantilevers for combined AFM imaging and electrical recording ( Sci Rep. 2014, 4, 4454.)